2 Channel 53V+ @1A PPMU
Whitney, an SoC breakthrough solution that incorporates all the necessary functions to test higher-power semiconductors in a single compact package. Whitney is designed to test the latest semiconductors found in automotive, consumer electronics, LED drivers, IoT, and PMIC. With its high-voltage technology, Whitney provides a low-glitch, fast-response, and high-density solution that can fit all customer needs and lower the cost of test. It is a two-channel high-voltage (-53V to +53V), high-current (up to 1A), and highly integrated System-on-a-Chip (SoC) per-pin Parametric Measurement Unit (PMU) and Device Power Supply (DPS), designed for the Automated Test Equipment (ATE) and semiconductor test markets.
Whitney is a high-performance SoC that integrates all functions needed to test advanced power semiconductors. With dual channels (-53V to +53V, up to 1A), it delivers fast, low-glitch performance in a compact, cost-efficient solution for ATE and semiconductor test applications.
Wide Output Voltage Range
2 Per Channel Monitor Pins
Up to 50MHz SPI Interface
On-Chip DC Levels
Package/Power Dissipation
Applications
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