Whitney, an SoC breakthrough solution that incorporates all the necessary functions to test higher-power semiconductors in a single compact package. Whitney is designed to test the latest semiconductors found in automotive, consumer electronics, LED drivers, IoT, and PMIC. With its high-voltage technology, Whitney provides a low-glitch, fast-response, and high-density solution that can fit all customer needs and lower the cost of test. It is a two-channel high-voltage (-53V to +53V), high-current (up to 1A), and highly integrated System-on-a-Chip (SoC) per-pin Parametric Measurement Unit (PMU) and Device Power Supply (DPS), designed for the Automated Test Equipment (ATE) and semiconductor test markets.